Phonon Scattering in Silicon by Multiple Morphological Defects: A Multiscale Analysis
Sign Up to like & getrecommendations! Published in 2018 at "Journal of Electronic Materials"
DOI: 10.1007/s11664-018-6337-z
Abstract: Ideal thermoelectric materials should possess low thermal conductivity $$\kappa $$κ along with high electrical conductivity $$\sigma $$σ. Thus, strategies are needed to impede the propagation of phonons mostly responsible for thermal conduction while only marginally… read more here.
Keywords: scattering silicon; multiple morphological; thermal conductivity; phonon scattering ... See more keywords
Reduction of morphological defects in 4H-SiC epitaxial layers
Sign Up to like & getrecommendations! Published in 2019 at "Journal of Crystal Growth"
DOI: 10.1016/j.jcrysgro.2018.10.023
Abstract: Abstract Correlation between morphological defects and device yield in the 4H-SiC epitaxial layers were investigated with overlapped morphological defect mapping and device yield mapping figures. The results show the harmful level of various morphological defects… read more here.
Keywords: triangular defects; sic epitaxial; epitaxial layers; morphological defects ... See more keywords
Characterization of morphological defects related to micropipes in 4H-SiC thick homoepitaxial layers
Sign Up to like & getrecommendations! Published in 2021 at "Journal of Crystal Growth"
DOI: 10.1016/j.jcrysgro.2021.126182
Abstract: Abstract A new type of morphological defects related to substrate micropipe is observed in 4H-SiC thick homoepitaxial layers. The structure and formation mechanism are investigated by optical microscopy, laser microscopy, scanning electron microscopy, micro-Raman spectroscopy,… read more here.
Keywords: defects related; microscopy; spectroscopy; morphological defects ... See more keywords
Systematic Investigation on the Performance and Reliability of 4H-SiC MOSFETs With Nonkiller Epitaxial Morphological Defects
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DOI: 10.1109/ted.2025.3556053
Abstract: Epitaxial morphological defects in silicon carbide (SiC) MOSFETs can induce device failures. While chip probing (CP) methods can identify and distinguish many failed devices, some nonkiller epitaxial morphological defects often pass the initial screening, leading… read more here.
Keywords: nonkiller epitaxial; reliability; performance; sic mosfets ... See more keywords
CORRELATING SPERM REACTIVE OXYGEN SPECIES PRODUCTION AND ITS MORPHOLOGICAL DEFECTS – WHICH CAN BE THE BEST POSSIBLE MORPHOLOGICAL PREDICTOR OF OXIDATIVE DAMAGE IN ROUTINE SCREENING?
Sign Up to like & getrecommendations! Published in 2017 at "International Journal of Approximate Reasoning"
DOI: 10.16965/ijar.2017.218
Abstract: Address for Correspondence: Dr. Dinesh Kumar. V, Assistant Professor, Department of Anatomy, Pondicherry Institute of Medical Sciences, Puducherry, India. E-Mail: [email protected] Introduction: Male infertility contributes to nearly 30% of the total infertile population worldwide. Despite… read more here.
Keywords: reactive oxygen; oxygen species; predictor oxidative; ros ... See more keywords
Histone Deacetylase Inhibitors Ameliorate Morphological Defects and Hypoexcitability of iPSC-Neurons from Rubinstein-Taybi Patients
Sign Up to like & getrecommendations! Published in 2021 at "International Journal of Molecular Sciences"
DOI: 10.3390/ijms22115777
Abstract: Rubinstein-Taybi syndrome (RSTS) is a rare neurodevelopmental disorder caused by mutations in CREBBP or EP300 genes encoding CBP/p300 lysine acetyltransferases. We investigated the efficacy of the histone deacetylase inhibitor (HDACi) Trichostatin A (TSA) in ameliorating… read more here.
Keywords: deacetylase inhibitors; histone deacetylase; rubinstein taybi; inhibitors ameliorate ... See more keywords