Optical properties of thickness-controlled MoS 2 thin films studied by spectroscopic ellipsometry
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DOI: 10.1016/j.apsusc.2016.09.069
Abstract: Abstract As a promising candidate for applications in future electronic and optoelectronic devices, MoS 2 has been a research focus in recent years. Therefore, investigating its optical properties is of practical significance. Here we synthesized… read more here.
Keywords: thin films; spectroscopic ellipsometry; optical properties; mos thin ... See more keywords