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Published in 2018 at "IEEE Microwave and Wireless Components Letters"
DOI: 10.1109/lmwc.2018.2851386
Abstract: The objective of this letter oriented toward micro-wave measurement of high-impedance devices using a conventional on-wafer probe station is multiple. First, we provided a quantification of the measurement uncertainty inherent to the setup when measuring…
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Keywords:
voltage tunable;
mos voltage;
series;
measurement ... See more keywords