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Published in 2021 at "Solid-state Electronics"
DOI: 10.1016/j.sse.2020.107949
Abstract: Abstract A detailed and didactic analysis of the diffusivity in a 2D inversion layer is carried out, providing its dependence on carrier density and temperature. Then, a comprehensive study of the diffusion and drift current…
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Keywords:
deep cryogenic;
mosfet operated;
current mosfet;
diffusion current ... See more keywords