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Published in 2017 at "IEEE Transactions on Device and Materials Reliability"
DOI: 10.1109/tdmr.2016.2644721
Abstract: Very large-scale integrated circuit design, based on today’s CMOS technologies, are facing various challenges. Shrinking transistor dimensions, reduction in threshold voltage, and lowering power supply voltage, cause new concerns such as high leakage current, and…
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Keywords:
mtj cmos;
power;
hybrid mtj;
cmos based ... See more keywords
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recommendations!
1
Published in 2018 at "IEEE Transactions on Magnetics"
DOI: 10.1109/tmag.2018.2833431
Abstract: As CMOS technology scales down to the nanoscale, high leakage power consumption becomes one of the major concerns in the design of electronic circuits. To overcome this challenge, nano-emerging technologies and logic-in-memory (LIM) structures are…
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Keywords:
mtj cmos;
cmos;
power;
mtj ... See more keywords