Articles with "multicycle tests" as a keyword



Test Compaction by Backward and Forward Extension of Multicycle Tests

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Published in 2021 at "IEEE Transactions on Very Large Scale Integration (VLSI) Systems"

DOI: 10.1109/tvlsi.2020.3028005

Abstract: Multicycle tests are useful for test compaction even when full scan allows single- or two-cycle tests to be used. To avoid sequential test generation, multicycle tests can use the test data (scan-in states and primary… read more here.

Keywords: multicycle; multicycle tests; test compaction; extension ... See more keywords