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Published in 2021 at "IEEE Transactions on Very Large Scale Integration (VLSI) Systems"
DOI: 10.1109/tvlsi.2020.3028005
Abstract: Multicycle tests are useful for test compaction even when full scan allows single- or two-cycle tests to be used. To avoid sequential test generation, multicycle tests can use the test data (scan-in states and primary…
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Keywords:
multicycle;
multicycle tests;
test compaction;
extension ... See more keywords