Microstructure of periodic metallic magnetic multilayer systems
Sign Up to like & getrecommendations! Published in 2017 at "Thin Solid Films"
DOI: 10.1016/j.tsf.2017.04.033
Abstract: Abstract The results of a complex microstructural analysis of periodic metallic magnetic multilayer systems (MLS) by Scanning/Transmission Electron Microscopy, Energy Dispersive X-ray microanalysis and Resonant X-ray Reflectivity (RXRR) are presented. The crystal structure of MLS… read more here.
Keywords: periodic metallic; microstructure periodic; multilayer systems; magnetic multilayer ... See more keywords
Post deposition nitridation of Si in W/Si soft X-ray multilayer systems
Sign Up to like & getrecommendations! Published in 2021 at "Thin Solid Films"
DOI: 10.1016/j.tsf.2021.138601
Abstract: Abstract Partial nitridation of W/Si multilayer systems with a 2.5 nm period was investigated in an attempt to reduce optically unfavorable tungsten silicide formation in the systems. Nitridation was applied directly after the deposition of… read more here.
Keywords: post deposition; ray; nitridation; multilayer systems ... See more keywords
Structural control in porous/compact multilayer systems grown by magnetron sputtering.
Sign Up to like & getrecommendations! Published in 2017 at "Nanotechnology"
DOI: 10.1088/1361-6528/aa8cf4
Abstract: In this work we analyze a phenomenon that takes place when growing magnetron sputtered porous/compact multilayer systems by alternating the oblique angle and the classical configuration geometries. We show that the compact layers develop numerous… read more here.
Keywords: porous compact; structural control; control porous; multilayer systems ... See more keywords
Simultaneous measurement of refractive index and thickness of multilayer systems using Fourier domain optical coherence tomography, part 1: theory
Sign Up to like & getrecommendations! Published in 2017 at "Journal of Biomedical Optics"
DOI: 10.1117/1.jbo.22.1.015002
Abstract: Abstract. We introduce a theoretical framework for simultaneous refractive index and thickness measurement of multilayer systems using the Fourier domain optical coherence tomography (FD-OCT) system without any previous information about the item under investigation. The… read more here.
Keywords: systems using; index; multilayer systems; index thickness ... See more keywords
Simultaneous measurement of refractive index and thickness of multilayer systems using Fourier domain optical coherence tomography, part 2: implementation
Sign Up to like & getrecommendations! Published in 2017 at "Journal of Biomedical Optics"
DOI: 10.1117/1.jbo.22.1.015003
Abstract: Abstract. We introduce a theoretical method for simultaneous measurement of refractive index and thickness of multilayer systems using Fourier domain optical coherence tomography (FD-OCT) without any auxiliary arrangement. The input data to the formalism are… read more here.
Keywords: thickness multilayer; index thickness; multilayer systems; simultaneous measurement ... See more keywords