An Empirical Study of the Impact of Single and Multiple Bit-Flip Errors in Programs
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DOI: 10.1109/tdsc.2020.3043023
Abstract: Recent studies have shown that technology and voltage scaling are expected to increase the likelihood that particle-induced soft errors manifest as multiple-bit errors. This raises concerns about the validity of using single bit-flips in fault… read more here.
Keywords: bit; impact; single bit; multiple bit ... See more keywords