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Published in 2017 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"
DOI: 10.1109/tcad.2017.2681063
Abstract: Scan test data compression is widely used in industry to reduce test data volume (TDV) and test application time (TAT). This paper shows how multiple scan chain expansion ratios can help to obtain high test…
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Keywords:
compression;
test compression;
expansion ratios;
multiple expansion ... See more keywords