Sign Up to like & get
recommendations!
0
Published in 2024 at "IEEE Transactions on Industrial Informatics"
DOI: 10.1109/tii.2024.3413304
Abstract: Few-shot new faults are constantly emerging due to the dynamic environments and operations in the industrial process. It is a challenge for existing fault diagnosis methods to diagnose few-shot new faults without forgetting old faults…
read more here.
Keywords:
fault incremental;
multiview shapelet;
shot fault;
shapelet prototypical ... See more keywords