Monitored Tomographic Reconstruction—An Advanced Tool to Study the 3D Morphology of Nanomaterials
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DOI: 10.3390/nano11102524
Abstract: Detailed and accurate three-dimensional (3D) information about the morphology of hierarchically structured materials is derived from multi-scale X-ray computed tomography (XCT) and subsequent 3D data reconstruction. High-resolution X-ray microscopy and nano-XCT are suitable techniques to… read more here.
Keywords: reconstruction; tomographic reconstruction; morphology; nano xct ... See more keywords