Thickness analysis of nanometer thin films based on electron yields
Sign Up to like & getrecommendations! Published in 2020 at "Indian Journal of Physics"
DOI: 10.1007/s12648-019-01673-7
Abstract: Determination of the thickness of a nanometer thin film is an important topic in the nanostructure characterization field. Currently, the X-ray photoelectron spectroscopy and the ellipsometer have been used to analyze the film thickness. This… read more here.
Keywords: thickness analysis; electron yields; film thickness; thickness ... See more keywords
Depth profiling of nanometer thin layers by laser desorption and laser postionization time-of-flight mass spectrometry
Sign Up to like & getrecommendations! Published in 2017 at "Journal of Analytical Atomic Spectrometry"
DOI: 10.1039/c7ja00081b
Abstract: A depth profiling technique has been developed and employed for ultra-thin layer analysis using a newly constructed laser desorption and laser postionization time-of-flight mass spectrometer (LD-LPI-TOFMS). This technique achieves the superiority of an extremely low… read more here.
Keywords: thin layers; depth profiling; laser desorption; nanometer thin ... See more keywords
Water-Induced Nanometer-Thin Crystalline Indium-Praseodymium Oxide Channel Layers for Thin-Film Transistors
Sign Up to like & getrecommendations! Published in 2022 at "Nanomaterials"
DOI: 10.3390/nano12162880
Abstract: We report water-induced nanometer-thin crystalline indium praseodymium oxide (In-Pr-O) thin-film transistors (TFTs) for the first time. This aqueous route enables the formation of dense ultrathin (~6 nm) In-Pr-O thin films with near-atomic smoothness (~0.2 nm).… read more here.
Keywords: crystalline indium; water induced; induced nanometer; nanometer thin ... See more keywords