Circuit modeling of the electro-thermal behavior of nanoscale bulk-FinFETs
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DOI: 10.1007/s10825-017-1058-8
Abstract: Because the selfheating effect (SE) influences the performance and reliability of gate oxide and interconnect lines, and SE is affected by circuit operation such as operating frequency, the spatial distribution and dynamic behaviors of SE… read more here.
Keywords: circuit modeling; bulk finfets; circuit; finfets circuit ... See more keywords