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Published in 2022 at "ACS applied materials & interfaces"
DOI: 10.1021/acsami.2c01460
Abstract: Conductive atomic force microscopy (C-AFM) is widely used to determine the electronic conductivity of a sample surface with nanoscale spatial resolution. However, the origin of possible artifacts has not been widely researched, hindering the accurate…
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Keywords:
nanoscale visualization;
electron conduction;
afm;
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Published in 2019 at "ACS nano"
DOI: 10.1021/acsnano.9b06302
Abstract: Conductive polymers are exceptionally promising for modular electrochemical applications including chemical sensors, bioelectronics, redox-flow batteries, and photo-electrochemical systems due to considerable synthetic tunability and ease of processing. Despite well-established structural heterogeneity in these systems, conventional…
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Keywords:
microscopy;
electrodes nanoscale;
nanoscale visualization;
conductive polymer ... See more keywords