Analytical modeling of the lattice and thermo-elastic coefficient mismatch-induced stress into silicon nanowires horizontally embedded on insulator-on-silicon substrates
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DOI: 10.1016/j.spmi.2016.12.001
Abstract: Abstract In the current work, an analytical model has been developed to estimate the amount of induced stress in nanowires which are horizontally embedded with different fractions within an Insulator-on-Silicon substrate. For estimating such stress,… read more here.
Keywords: induced stress; horizontally embedded; thermo elastic; nanowires horizontally ... See more keywords