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Published in 2020 at "Semiconductors"
DOI: 10.1134/s1063782620020153
Abstract: The prospects for the protection of high-voltage 4H-SiC-devices from edge breakdown via the formation of mesa structures with inclined walls (negative beveling) are considered. Numerical simulation of the spatial electric-field distribution in high-voltage (~1500V) reverse-biased…
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Keywords:
high voltage;
sic devices;
negative beveling;
edge termination ... See more keywords