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Published in 2019 at "Ultramicroscopy"
DOI: 10.1016/j.ultramic.2019.02.013
Abstract: Due to continued advances in phosphor sensitivity and camera technology, electron backscattered diffraction (EBSD) within a scanning electron microscope (SEM) has become an increasingly popular method for determining crystal orientations within a given microstructure. Concurrent…
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Keywords:
smoothing enhanced;
non local;
pattern;
local smoothing ... See more keywords