Mitigating the thermally induced single event crosstalk
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DOI: 10.1007/s10470-017-0992-5
Abstract: With advances in technology scaling, circuits become increasingly more sensitive to transient pulses caused by single event (SE) particles. With scaling, interconnects are also being laid closer to each other causing increased cross-coupling noise effects.… read more here.
Keywords: noise effects; thermally induced; crosstalk noise; crosstalk ... See more keywords