A smart noise- and RTN-removal method for parameter extraction of CMOS aging compact models
Sign Up to like & getrecommendations! Published in 2019 at "Solid-State Electronics"
DOI: 10.1016/j.sse.2019.03.045
Abstract: Abstract In modern nanometer-scale CMOS technologies, time-zero and time-dependent variability (TDV) effects, the latter coming from aging mechanisms like Bias Temperature Instability (BTI), Hot Carrier Injection (HCI) or Random Telegraph Noise (RTN), have re-emerged as… read more here.
Keywords: method; rtn; smart noise; noise rtn ... See more keywords