Excess noise and thermoelectric effect in magnetron-sputtered VO2 thin films
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DOI: 10.1063/5.0218097
Abstract: This work presents the excess noise and thermoelectric (Seebeck) measurements on polycrystalline vanadium dioxide (VO2) thin films. Noise spectral power density (SPD) of current fluctuations in the semiconducting (SC) phase had a typical flicker noise… read more here.
Keywords: noise thermoelectric; excess noise; thin films; vo2 thin ... See more keywords