Enhancing the metrological performance of non-raster scanning probe microscopy using Gaussian process regression
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DOI: 10.1088/1361-6501/ab1d27
Abstract: Non-raster scanning has been proved to be an effective approach to dramatically improve the efficiency of the scanning probe microscopy without sophisticated scanners and controllers. However, the metrological performance of the method largely depends on… read more here.
Keywords: regression; microscopy; non raster; raster scanning ... See more keywords