Weak and Strong Non-Robust Tests for Functionally Possible Path Delay Faults
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DOI: 10.1109/access.2024.3486057
Abstract: Small delay defects are caused by fabrication imperfections as well as chip aging, and detected by tests for path delay faults. Path delay faults that can cause failures during functional operation are especially important to… read more here.
Keywords: strong non; delay faults; non robust; path delay ... See more keywords