Nondestructive X-ray diffraction measurement of warpage in silicon dies embedded in integrated circuit packages1
Sign Up to like & getrecommendations! Published in 2017 at "Journal of Applied Crystallography"
DOI: 10.1107/s1600576717003132
Abstract: X-ray diffraction imaging in both monochromatic and white beam section mode has been used to measure quantitatively the displacement and warpage stress in encapsulated silicon devices. read more here.
Keywords: ray diffraction; diffraction measurement; warpage; nondestructive ray ... See more keywords
Features of surface preparation for nondestructive X-ray diagnostics of the stress state of railway metal critical parts
Sign Up to like & getrecommendations! Published in 2017 at "Inorganic Materials: Applied Research"
DOI: 10.1134/s2075113317010257
Abstract: By example of samples of railway transport parts of cast and wrought steels, a need for surface preparation for X-ray measurements of surface stress providing removal of a cold-hardened surface layer 150–200 μm thick is… read more here.
Keywords: surface preparation; nondestructive ray; features surface; preparation ... See more keywords