Automated instrumentation for nonequilibrium capacitance–voltage measurements at a semiconductor–electrolyte interface
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DOI: 10.1134/s0020441216060014
Abstract: An apparatus for measuring nonequilibrium capacitance–voltage characteristics in semiconductor structures with electrolytic contacts is described. A pulse CV method was used in which a space-charge region in the deep-depletion mode was created via application of… read more here.
Keywords: voltage; semiconductor; nonequilibrium capacitance; capacitance voltage ... See more keywords