Nonintrusive Characterization Method for Integrated Optical Delay Lines
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DOI: 10.1109/jlt.2024.3380637
Abstract: In this work we present an automatic calibration technique for switched Optical True Time Delay Lines which allows the control of all of the switchers without relaying on intermediate attenuators nor external test ports, thus… read more here.
Keywords: delay lines; method integrated; nonintrusive characterization; delay ... See more keywords