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Published in 2018 at "IEEE Transactions on Nanotechnology"
DOI: 10.1109/tnano.2018.2849404
Abstract: Scanning probe microscopy (SPM) based nanomanipulators always experience probe accuracy issues caused by uncertainties such as scanner hysteresis, drifts, and interaction forces. Although some SPMs contain internal position sensors, they can hardly sense real probe…
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Keywords:
control;
envs;
control strategy;
nonvector space ... See more keywords