A novel defect detection method with eliminating dust for specular surfaces based on structured-light modulation analysis technique
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DOI: 10.1016/j.optlastec.2021.107089
Abstract: Abstract In modern industrial manufacturing, the demand for the surface inspection of specular objects has become more and more urgent. In this paper, a novel defect detection method with eliminating dust is systematically proposed to… read more here.
Keywords: defect detection; detection method; novel defect; method eliminating ... See more keywords