Thermal Aware Test Scheduling for NTV Circuit
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DOI: 10.1109/tcad.2017.2729282
Abstract: Although the near threshold voltage (NTV) design has achieved energy efficiency, certain challenges remain regarding its application. In this paper, we describe the analysis of thermally induced reliability concern in test process. In an NTV… read more here.
Keywords: ntv; test; circuit; test scheduling ... See more keywords