Observation of in-plane shear stress fields in off-axis SiC wafers by birefringence imaging
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DOI: 10.1107/s1600576722006483
Abstract: Theoretical consideration and experimental demonstration reveal that the contrast variation in a birefringence image of an off-axis SiC wafer corresponds to the in-plane shear stress field. read more here.
Keywords: plane shear; observation plane; axis sic; birefringence ... See more keywords