Uniqueness of parameter estimates obtained from fitting free carrier absorption data of silicon wafers
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DOI: 10.1063/5.0059258
Abstract: In this paper, a data processing method is employed to improve the uniqueness of the electronic transport parameters (the carrier lifetime, carrier diffusion coefficient, and front and rear surface recombination velocities) obtained from fitting free… read more here.
Keywords: fitting free; free carrier; carrier absorption; carrier ... See more keywords