Opportunities for Electron Backscattered Diffraction Enabled by Direct Electron Detection
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DOI: 10.1017/s1431927620017171
Abstract: Electron backscattered diffraction (EBSD) in the scanning electron microscope (SEM) has evolved to be an indispensable technique in materials research for phase identification, crystal orientation determination, orientation gradients, and lattice strain mapping. While tremendous gains… read more here.
Keywords: opportunities electron; backscattered diffraction; ebsd; diffraction ... See more keywords