Spectro‐Spatial Unmixing in Optical Microspectroscopy for Thickness Determination of Layered Materials
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DOI: 10.1002/adom.202402502
Abstract: Van der Waals materials and devices incorporating them exhibit highly thickness‐dependent properties. The small lateral dimensions of mechanically exfoliated 2D‐layered flakes, however, remarkably complicate their precise thickness determination. Quantitative analysis of reflectance measurements using optical… read more here.
Keywords: reflectance; determination; optical microspectroscopy; thickness determination ... See more keywords