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Published in 2020 at "IEEE Transactions on Very Large Scale Integration (VLSI) Systems"
DOI: 10.1109/tvlsi.2020.3017950
Abstract: A framework is presented to identify an optimal accelerated test region and accelerated test conditions for the accelerated test of logic circuits for time-dependent dielectric breakdown (TDDB). Both gate-oxide breakdown and middle-of-line (MOL) TDDB are…
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Keywords:
test;
test conditions;
accelerated test;
optimal accelerated ... See more keywords
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Published in 2020 at "Frontiers in Neurology"
DOI: 10.3389/fneur.2020.599918
Abstract: Department of Cognitive Neuroscience, Faculty of Psychology and Neuroscience, Maastricht University, Maastricht, Netherlands, Department of Psychiatry and Neuropsychology, School for Mental Health and Neuroscience (MHeNS), Maastricht, Netherlands, Centre for Integrative Neuroscience, Faculty of Psychology and…
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Keywords:
maastricht netherlands;
design optimal;
neuroscience;
neuroscience faculty ... See more keywords