An Optimized Scanning-Based AFM Fast Imaging Method
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DOI: 10.1109/tmech.2020.2969355
Abstract: Atomic force microscopy (AFM) generally relies on a raster scanning method to obtain the sample morphology, which limits its scanning speed and application prospect. To solve this issue, this article proposes an optimized scanning-based fast… read more here.
Keywords: based afm; method; scanning based; optimized scanning ... See more keywords