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Published in 2019 at "Microscopy and Microanalysis"
DOI: 10.1017/s1431927619003386
Abstract: Shuttle and Find helps to solve the difficulty for the microscopist who seeks to examine progressively smaller features using an increasingly large collection of imaging and analytical instruments. The difficultly is most keenly felt when…
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Keywords:
features shuttle;
new features;
orion nanofab;
nanofab new ... See more keywords