Intermediate phase with orthorhombic symmetry displacement patterns in epitaxial PbZrO3 thin films at high temperatures
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DOI: 10.1080/00150193.2018.1470826
Abstract: Abstract Antiferroelectric PbZrO3 epitaxial thin film with thickness of 50 nm grown on the SrTiO3 substrate with SrRuO3 buffer layer was studied by Grazing incidence X-ray diffraction in a wide range of temperatures. Apart from the… read more here.
Keywords: phase; phase orthorhombic; orthorhombic symmetry; pbzro3 ... See more keywords