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Published in 2017 at "IEEE Transactions on Components, Packaging and Manufacturing Technology"
DOI: 10.1109/tcpmt.2017.2720421
Abstract: By using a specially designed apparatus, the impact of poor contacts caused by an incomplete overlap of a copper conductor and the corresponding terminal of the low-voltage electrical equipment on the contact temperature was tested.…
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Keywords:
overlap copper;
contact temperature;
copper;
copper conductor ... See more keywords