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Published in 2025 at "IEEE Transactions on Automation Science and Engineering"
DOI: 10.1109/tase.2024.3506120
Abstract: Existing works have made some progress in point cloud registration, but most of them measure performance only on point cloud pairs with high overlap. In practical applications, it is often difficult to ensure that the…
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Keywords:
overlap point;
point;
point cloud;
low overlap ... See more keywords
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Published in 2025 at "IEEE Transactions on Industrial Informatics"
DOI: 10.1109/tii.2024.3507933
Abstract: In recent years, the local feature-based point cloud registration methods have attracted more attention for their high robustness. The state-of-the-art local feature-based pipeline consists of local feature extraction, feature matching, and outlier rejection. However, the…
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Keywords:
overlap point;
point;
point cloud;
low overlap ... See more keywords