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Published in 2018 at "Ultramicroscopy"
DOI: 10.1016/j.ultramic.2017.08.004
Abstract: Mass spectral overlaps in atom probe tomography (APT) analyses of complex compounds typically limit the identification of elements and microstructural analysis of a material. This study concerns the TiSiN system, chosen because of severe mass-to-charge-state…
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Keywords:
atom probe;
overlaps atom;
mass;
spectral overlaps ... See more keywords