A Physically Unclonable Function Using Soft Oxide Breakdown Featuring 0% Native BER and 51.8 fJ/bit in 40-nm CMOS
Sign Up to like & getrecommendations! Published in 2019 at "IEEE Journal of Solid-State Circuits"
DOI: 10.1109/jssc.2019.2920714
Abstract: This paper presents a physically unclonable function (PUF) based on the randomness of soft gate oxide breakdown (BD) locations in MOSFETs, namely, soft-BD PUF. The proposed PUF circuit features a self-limiting mechanism that generates exactly… read more here.
Keywords: unclonable function; puf; physically unclonable; oxide breakdown ... See more keywords
Unveiling the Vulnerability of Oxide-Breakdown-Based PUF
Sign Up to like & getrecommendations! Published in 2024 at "IEEE Electron Device Letters"
DOI: 10.1109/led.2024.3369860
Abstract: This work reports a potential vulnerability of an oxide-breakdown-based Physical Unclonable Function (PUF). This generates a unique chip key based on the stochastic competition between the formation of oxide breakdown in pairs of identical transistors.… read more here.
Keywords: vulnerability oxide; unveiling vulnerability; breakdown based; puf ... See more keywords