A Physically Unclonable Function Using Soft Oxide Breakdown Featuring 0% Native BER and 51.8 fJ/bit in 40-nm CMOS
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DOI: 10.1109/jssc.2019.2920714
Abstract: This paper presents a physically unclonable function (PUF) based on the randomness of soft gate oxide breakdown (BD) locations in MOSFETs, namely, soft-BD PUF. The proposed PUF circuit features a self-limiting mechanism that generates exactly… read more here.
Keywords: unclonable function; puf; physically unclonable; oxide breakdown ... See more keywords