Thickness Measurement of Oxide and Carbonaceous Layers on a 28Si Sphere by XPS
Sign Up to like & getrecommendations! Published in 2017 at "IEEE Transactions on Instrumentation and Measurement"
DOI: 10.1109/tim.2016.2634678
Abstract: Surface layer characterization is crucial for the high-accuracy determination of the Avogadro constant using 28Si enriched spheres to redefine the kilogram. In this paper, we measured the thickness of the oxide layer (OL) and carbonaceous… read more here.
Keywords: oxide carbonaceous; sphere xps; thickness measurement; measurement oxide ... See more keywords