An Online Condition Monitoring Method for IGBT Gate Oxide Degradation Based on the Gate Current in Miller Plateau
Sign Up to like & getrecommendations! Published in 2023 at "IEEE Transactions on Industrial Electronics"
DOI: 10.1109/tie.2022.3210581
Abstract: The reliability of power converters is one of the important issues due to the widespread applications of power electronics in many industrial fields. Accordingly, condition monitoring (CM) methods for the assessment of the health of… read more here.
Keywords: gate oxide; condition monitoring; method; gate ... See more keywords
Online Condition Monitoring of Power MOSFET Gate Oxide Degradation Based on Miller Platform Voltage
Sign Up to like & getrecommendations! Published in 2017 at "IEEE Transactions on Power Electronics"
DOI: 10.1109/tpel.2016.2602323
Abstract: The condition monitoring problem of power devices is significant for diagnostics and prognostics of a switched-mode power supply (SMPS) system. For power mosfet, the gate oxide degradation often occurs in various applications. However, there is… read more here.
Keywords: condition monitoring; gate oxide; oxide degradation; power ... See more keywords