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   Articles with "parameter measurement" as a keyword



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Effects of optical parameter measurement uncertainties and solar irradiance fluctuations on solar sailing

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recommendations! Published in 2019 at "Advances in Space Research"

DOI: 10.1016/j.asr.2019.11.037

Abstract: Abstract The heliocentric orbital dynamics of a spacecraft propelled by a solar sail is affected by some uncertainty sources, including possible inaccuracies in the measurement of the sail film optical properties. Moreover, the solar radiation… read more here.

Keywords: parameter measurement; optical parameter; measurement uncertainties; solar sail ... See more keywords

A miniaturized low-power vector impedance analyser for accurate multi-parameter measurement

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recommendations! Published in 2019 at "Measurement"

DOI: 10.1016/j.measurement.2019.05.003

Abstract: Abstract Distributed measurements are important in many application fields, from environment to biomedicine. In both cases, the sensor nodes employed in the measurement network have to satisfy many requirements; among them, the most important ones… read more here.

Keywords: multi parameter; power; low power; parameter measurement ... See more keywords

A Framework for Compound Interrupted Sampling Repeater Jamming Parameter Measurement

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recommendations! Published in 2025 at "IEEE Transactions on Instrumentation and Measurement"

DOI: 10.1109/tim.2025.3540128

Abstract: Active compound jamming, particularly compound interrupted sampling repeater jamming (ISRJ), possesses excellent flexibility and jamming effectiveness, making it one of the major threats to radar systems. Accurately measuring the key parameters of each ISRJ component… read more here.

Keywords: compound; measurement; compound isrj; parameter measurement ... See more keywords

A Novel Four-Port Symmetric Probe Calibration Method for On-Wafer S-Parameter Measurement

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recommendations! Published in 2024 at "IEEE Transactions on Microwave Theory and Techniques"

DOI: 10.1109/tmtt.2023.3319049

Abstract: This article presents a novel four-port symmetric probe calibration method for on-wafer S-parameter measurement, where by using the symmetric property of the probes, the four-port calibration process is greatly simplified while maintaining a high calibration… read more here.

Keywords: calibration method; method; parameter measurement; four port ... See more keywords