Accurate and Efficient Self-Calibration Algorithm of Broadband On-Wafer Scattering-Parameter Measurements for Production Test Applications Up to 110 GHz
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DOI: 10.1109/tcpmt.2017.2672700
Abstract: This paper presents an accurate and efficient on-wafer calibration algorithm of broadband scattering-parameter measurements for radio-frequency integrated circuit production test applications. Three on-chip calibration standards with the same probe positions as those of the devices… read more here.
Keywords: algorithm broadband; calibration algorithm; scattering parameter; calibration ... See more keywords