Determination of the input parameters for inelastic background analysis combined with HAXPES using a reference sample
Sign Up to like & getrecommendations! Published in 2018 at "Applied Surface Science"
DOI: 10.1016/j.apsusc.2017.06.081
Abstract: Abstract The recent progress in HAXPES combined with Inelastic Background Analysis makes this method a powerful, non-destructive solution to get quantitative information on deeply buried layers and interfaces at depths up to 70 nm. However, we… read more here.
Keywords: input parameters; parameters inelastic; analysis; reference ... See more keywords