Extraction of device S-parameters within board by using a TRL de-embedding technique
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DOI: 10.1002/mop.31473
Abstract: Semiconductor devices are tested within a complex environment including a loadboard and a socket. In this paper, we propose a calibration methodology and a RF de‐embedding technique that allows the extraction of the device parameters.… read more here.
Keywords: parameters within; embedding technique; device parameters; extraction device ... See more keywords