Efficient Parametric Yield Estimation Over Multiple Process Corners via Bayesian Inference Based on Bernoulli Distribution
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DOI: 10.1109/tcad.2019.2940682
Abstract: Parametric yield estimation over multiple process corners plays an important role in robust circuit design. In this article, we propose a novel Bayesian inference method based on Bernoulli distribution (BI-BD) to efficiently estimate the multicorner… read more here.
Keywords: yield estimation; estimation multiple; bayesian inference; parametric yield ... See more keywords