Analysis, Modeling, and Mitigation of Parasitic Resonances in Integrated Metallic Seal Rings
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DOI: 10.1109/tcpmt.2017.2774188
Abstract: The cause of a measured −1.4-dB dip at 80 GHz in a silicon capacitor was investigated and determined to be the primary resonance of the integrated metal seal ring (SR) enclosing the component. Specifically, the… read more here.
Keywords: parasitic resonances; analysis modeling; resonance; frequency ... See more keywords