Thickness measurement of transparent liquid films with Paraxial Self-Reference Interferometry
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DOI: 10.1038/s41598-020-65799-z
Abstract: In this paper, we introduce a non-invasive optical method, named Paraxial Self-Reference Interferometry (PSRI) for thickness measurement of liquid films. The method can be used for thin or thick layers (from μm to mm) of… read more here.
Keywords: self reference; paraxial self; thickness measurement; liquid films ... See more keywords