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Published in 2021 at "IEEE Transactions on Electron Devices"
DOI: 10.1109/ted.2021.3064531
Abstract: The underlying mechanism responsible for the unique dynamic ON-resistance behavior is unified by demonstrating the presence of critical drain stress voltage, above which dynamic ON-resistance increases significantly, in different gate stacks. Metal–insulator–semiconductor (MIS)- and Schottky-gated…
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Keywords:
passivation;
surface;
surface passivation;
passivation scheme ... See more keywords